Test and diagnosis pattern generation for dynamic bridging faults and transition delay faults - researchr publication authors

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Cheng-Hung Wu, Saint James Lee, Kuen-Jong Lee. Test and diagnosis pattern generation for dynamic bridging faults and transition delay faults. In 21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016, Macao, Macao, January 25-28, 2016. pages 755-760, IEEE, 2016. [doi]

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