Angus Wu, Tai-Shan Lin, C. Tseng, Jack L. Meador. Neural network diagnosis of IC faults. In 9th IEEE VLSI Test Symposium (VTS'91), 15-17 Apr 1991, Atlantic City, NJ, USA. pages 199-203, IEEE, 1991. [doi]
@inproceedings{WuLTM91,
title = {Neural network diagnosis of IC faults},
author = {Angus Wu and Tai-Shan Lin and C. Tseng and Jack L. Meador},
year = {1991},
doi = {10.1109/VTEST.1991.208158},
url = {http://dx.doi.org/10.1109/VTEST.1991.208158},
researchr = {https://researchr.org/publication/WuLTM91},
cites = {0},
citedby = {0},
pages = {199-203},
booktitle = {9th IEEE VLSI Test Symposium (VTS'91), 15-17 Apr 1991, Atlantic City, NJ, USA},
publisher = {IEEE},
}