Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Angus Wu, Tai-Shan Lin, C. Tseng, Jack L. Meador. Neural network diagnosis of IC faults. In 9th IEEE VLSI Test Symposium (VTS'91), 15-17 Apr 1991, Atlantic City, NJ, USA. pages 199-203, IEEE, 1991. [doi]
Abstract is missing.