A Retention-Error Mitigation Method on TLC NAND Flash Memory for CE Storage Systems

Chin-Hsien Wu, Yi-Lun Lan, Wei-Hao Wu, Chi-Yen Yang. A Retention-Error Mitigation Method on TLC NAND Flash Memory for CE Storage Systems. In IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2021, Penghu, Taiwan, September 15-17, 2021. pages 1-2, IEEE, 2021. [doi]

Abstract

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