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Investigations on the EFT immunity of microcontrollers with different architectures

J. Wu, B. Li, W. Zhu, H. Wang, L. Zheng. Investigations on the EFT immunity of microcontrollers with different architectures. Microelectronics Reliability, 76:708-713, 2017. [doi]

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J. Wu

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B. Li

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W. Zhu

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H. Wang

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L. Zheng

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