J. Wu, B. Li, W. Zhu, H. Wang, L. Zheng. Investigations on the EFT immunity of microcontrollers with different architectures. Microelectronics Reliability, 76:708-713, 2017. [doi]
@article{WuLZWZ17,
title = {Investigations on the EFT immunity of microcontrollers with different architectures},
author = {J. Wu and B. Li and W. Zhu and H. Wang and L. Zheng},
year = {2017},
doi = {10.1016/j.microrel.2017.06.078},
url = {https://doi.org/10.1016/j.microrel.2017.06.078},
researchr = {https://researchr.org/publication/WuLZWZ17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {76},
pages = {708-713},
}