Yuejian Wu, Paul N. MacDonald. Testing ASICs with multiple identical cores. IEEE Trans. on CAD of Integrated Circuits and Systems, 22(3):327-336, 2003. [doi]
@article{WuM03:1,
title = {Testing ASICs with multiple identical cores},
author = {Yuejian Wu and Paul N. MacDonald},
year = {2003},
doi = {10.1109/TCAD.2002.807889},
url = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2002.807889},
tags = {testing},
researchr = {https://researchr.org/publication/WuM03%3A1},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {22},
number = {3},
pages = {327-336},
}