Angus Wu, Jack L. Meador. Measurement selection for parametric IC fault diagnosis. J. Electronic Testing, 5(1):9-18, 1994. [doi]
@article{WuM94:0,
title = {Measurement selection for parametric IC fault diagnosis},
author = {Angus Wu and Jack L. Meador},
year = {1994},
doi = {10.1007/BF00971959},
url = {http://dx.doi.org/10.1007/BF00971959},
researchr = {https://researchr.org/publication/WuM94%3A0},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {5},
number = {1},
pages = {9-18},
}