Kai-Chiang Wu, Diana Marculescu, Ming-Chao Lee, Shih-Chieh Chang. Analysis and mitigation of NBTI-induced performance degradation for power-gated circuits. In Vojin G. Oklobdzija, Barry Pangle, Naehyuck Chang, Naresh R. Shanbhag, Chris H. Kim, editors, Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010, Austin, Texas, USA, August 18-20, 2010. pages 139-144, ACM, 2011. [doi]
@inproceedings{WuMLC11,
title = {Analysis and mitigation of NBTI-induced performance degradation for power-gated circuits},
author = {Kai-Chiang Wu and Diana Marculescu and Ming-Chao Lee and Shih-Chieh Chang},
year = {2011},
url = {http://portal.acm.org/citation.cfm?id=2016840&CFID=34981777&CFTOKEN=25607807},
tags = {analysis},
researchr = {https://researchr.org/publication/WuMLC11},
cites = {0},
citedby = {0},
pages = {139-144},
booktitle = {Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010, Austin, Texas, USA, August 18-20, 2010},
editor = {Vojin G. Oklobdzija and Barry Pangle and Naehyuck Chang and Naresh R. Shanbhag and Chris H. Kim},
publisher = {ACM},
isbn = {978-1-4503-0146-6},
}