Cutting Tool Surface Defect Detection based on Chaos Difference Method in Manufacturing Process

Ziqin Wu, Weilong Niu, Xiaoguang Sun, Li Chen. Cutting Tool Surface Defect Detection based on Chaos Difference Method in Manufacturing Process. In 20th IEEE International Conference on Automation Science and Engineering, CASE 2024, Bari, Italy, August 28 - Sept. 1, 2024. pages 2863-2868, IEEE, 2024. [doi]

Possibly Related Publications

The following publications are possibly variants of this publication: