Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui. Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs. In IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020. pages 1-10, IEEE, 2020. [doi]
@inproceedings{WuRTMKH20-0,
title = {Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs},
author = {Lizhou Wu and Siddharth Rao and Mottaqiallah Taouil and Erik Jan Marinissen and Gouri Sankar Kar and Said Hamdioui},
year = {2020},
doi = {10.1109/ITC44778.2020.9325258},
url = {https://doi.org/10.1109/ITC44778.2020.9325258},
researchr = {https://researchr.org/publication/WuRTMKH20-0},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {IEEE International Test Conference, ITC 2020, Washington, DC, USA, November 1-6, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9113-3},
}