Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui. Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs. IEEE Transactions on Computers, 71(9):2219-2233, 2022. [doi]
Abstract is missing.