Si Wu, Zhirong Shen, Patrick P. C. Lee. Enabling I/O-Efficient Redundancy Transitioning in Erasure-Coded KV Stores via Elastic Reed-Solomon Codes. In International Symposium on Reliable Distributed Systems, SRDS 2020, Shanghai, China, September 21-24, 2020. pages 246-255, IEEE, 2020. [doi]
Abstract is missing.