Wei Wu, Sheldon X.-D. Tan, Jun Yang, Shih-Lien Lu. Improving the reliability of on-chip data caches under process variations. In 25th International Conference on Computer Design, ICCD 2007, 7-10 October 2007, Lake Tahoe, CA, USA, Proceedings. pages 325-332, IEEE, 2007. [doi]
@inproceedings{WuTYL07, title = {Improving the reliability of on-chip data caches under process variations}, author = {Wei Wu and Sheldon X.-D. Tan and Jun Yang and Shih-Lien Lu}, year = {2007}, doi = {10.1109/ICCD.2007.4601920}, url = {http://dx.doi.org/10.1109/ICCD.2007.4601920}, tags = {caching, data-flow, reliability}, researchr = {https://researchr.org/publication/WuTYL07}, cites = {0}, citedby = {0}, pages = {325-332}, booktitle = {25th International Conference on Computer Design, ICCD 2007, 7-10 October 2007, Lake Tahoe, CA, USA, Proceedings}, publisher = {IEEE}, isbn = {1-4244-1258-7}, }