Wei Wu, Sheldon X.-D. Tan, Jun Yang, Shih-Lien Lu. Improving the reliability of on-chip data caches under process variations. In 25th International Conference on Computer Design, ICCD 2007, 7-10 October 2007, Lake Tahoe, CA, USA, Proceedings. pages 325-332, IEEE, 2007. [doi]
Abstract is missing.