A Fast Algorithm for Critical Path Tracing in VLSI Digital Circuits - researchr publication

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Lei Wu, D. M. H. Walker. A Fast Algorithm for Critical Path Tracing in VLSI Digital Circuits. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 178-186, IEEE Computer Society, 2005. [doi]

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