Cheng-Hung Wu, Yi-Da Wang, Kuen-Jong Lee. Improve transition fault diagnosability via observation point insertion. In VLSI Design, Automation and Test, VLSI-DAT 2015, Hsinchu, Taiwan, April 27-29, 2015. pages 1-4, IEEE, 2015. [doi]
@inproceedings{WuWL15-2,
title = {Improve transition fault diagnosability via observation point insertion},
author = {Cheng-Hung Wu and Yi-Da Wang and Kuen-Jong Lee},
year = {2015},
doi = {10.1109/VLSI-DAT.2015.7114571},
url = {http://dx.doi.org/10.1109/VLSI-DAT.2015.7114571},
researchr = {https://researchr.org/publication/WuWL15-2},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {VLSI Design, Automation and Test, VLSI-DAT 2015, Hsinchu, Taiwan, April 27-29, 2015},
publisher = {IEEE},
isbn = {978-1-4799-6275-4},
}