A CAM-Based Weakly Supervised Method for Surface Defect Inspection - researchr publication authors

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Xiaojun Wu, Tuo Wang, Yiming Li, Peng Li 0019, Yunhui Liu. A CAM-Based Weakly Supervised Method for Surface Defect Inspection. IEEE T. Instrumentation and Measurement, 71:1-10, 2022. [doi]

This author has not been identified. Look up 'Xiaojun Wu' in GoogleThis author has not been identified. Look up 'Tuo Wang' in GoogleThis author has not been identified. Look up 'Yiming Li' in GoogleThis author has not been identified. Look up 'Peng Li 0019' in GoogleThis author has not been identified. Look up 'Yunhui Liu' in Google

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