A CAM-Based Weakly Supervised Method for Surface Defect Inspection

Xiaojun Wu, Tuo Wang, Yiming Li, Peng Li 0019, Yunhui Liu. A CAM-Based Weakly Supervised Method for Surface Defect Inspection. IEEE T. Instrumentation and Measurement, 71:1-10, 2022. [doi]

Abstract

Abstract is missing.