Tao Wu, Yanling Wan, Yishan Xi, Chuanbo Chen. Study on the Automatic Test Framework Based on Three-tier Data Driven Mechanism. In Huaikou Miao, Gongzhu Hu, editors, 8th IEEE/ACIS International Conference on Computer and Information Science, IEEE/ACIS ICIS 2009, June 1-3, 2009, Shanghai, China. pages 996-1001, IEEE Computer Society, 2009. [doi]
Abstract is missing.