Upscaling of Single-Site-Based Measurements for Validation of Long-Term Coarse-Pixel Albedo Products

Xiaodan Wu, Jianguang Wen, Qing Xiao, Dongqin You. Upscaling of Single-Site-Based Measurements for Validation of Long-Term Coarse-Pixel Albedo Products. IEEE T. Geoscience and Remote Sensing, 58(5):3411-3425, 2020. [doi]

Abstract

Abstract is missing.