A dynamic synchronization method to realize soft defect localization applied on digital and mixed-mode analog ICs in failure analysis

Chunlei Wu, SuYing Yao. A dynamic synchronization method to realize soft defect localization applied on digital and mixed-mode analog ICs in failure analysis. Microelectronics Reliability, 54(5):993-999, 2014. [doi]

Authors

Chunlei Wu

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SuYing Yao

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