Chunlei Wu, SuYing Yao. A dynamic synchronization method to realize soft defect localization applied on digital and mixed-mode analog ICs in failure analysis. Microelectronics Reliability, 54(5):993-999, 2014. [doi]
@article{WuY14-4,
title = {A dynamic synchronization method to realize soft defect localization applied on digital and mixed-mode analog ICs in failure analysis},
author = {Chunlei Wu and SuYing Yao},
year = {2014},
doi = {10.1016/j.microrel.2014.01.021},
url = {http://dx.doi.org/10.1016/j.microrel.2014.01.021},
researchr = {https://researchr.org/publication/WuY14-4},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {5},
pages = {993-999},
}