On the Robustness of Cognate Generation Models

Winston Wu, David Yarowsky. On the Robustness of Cognate Generation Models. In Nicoletta Calzolari, Frédéric Béchet, Philippe Blache, Khalid Choukri, Christopher Cieri, Thierry Declerck, Sara Goggi, Hitoshi Isahara, Bente Maegaard, Joseph Mariani, Hélène Mazo, Jan Odijk, Stelios Piperidis, editors, Proceedings of the Thirteenth Language Resources and Evaluation Conference, LREC 2022, Marseille, France, 20-25 June 2022. pages 4299-4305, European Language Resources Association, 2022. [doi]

Abstract

Abstract is missing.