Yefan Wu, Jiangang Yao, Tangbing Li, Peng Fu, Wei Liao, Mi Zhang. Application of Image Processing Techniques in Infrared Detection of Faulty Insulators. In Shutao Li, Chenglin Liu, Yaonan Wang, editors, Pattern Recognition - 6th Chinese Conference, CCPR 2014, Changsha, China, November 17-19, 2014. Proceedings, Part II. Volume 484 of Communications in Computer and Information Science, pages 189-198, Springer, 2014. [doi]
Abstract is missing.