Deep Technology Tracing for High-Tech Companies

Han Wu, Kun Zhang, Guangyi Lv, Qi Liu, Runlong Yu, Weihao Zhao, Enhong Chen, Jianhui Ma. Deep Technology Tracing for High-Tech Companies. In Jianyong Wang, Kyuseok Shim, Xindong Wu 0001, editors, 2019 IEEE International Conference on Data Mining, ICDM 2019, Beijing, China, November 8-11, 2019. pages 1396-1401, IEEE, 2019. [doi]

Abstract

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