Electrical Characterization for Intertier Connections and Timing Analysis for 3-D ICs

Xiaoxia Wu, Wei Zhao, Mark Nakamoto, Chandra Nimmagadda, Durodami Lisk, Sam Gu, Riko Radojcic, Matt Nowak, Yuan Xie. Electrical Characterization for Intertier Connections and Timing Analysis for 3-D ICs. IEEE Trans. VLSI Syst., 20(1):186-191, 2012. [doi]

@article{WuZNNLGRNX12,
  title = {Electrical Characterization for Intertier Connections and Timing Analysis for 3-D ICs},
  author = {Xiaoxia Wu and Wei Zhao and Mark Nakamoto and Chandra Nimmagadda and Durodami Lisk and Sam Gu and Riko Radojcic and Matt Nowak and Yuan Xie},
  year = {2012},
  doi = {10.1109/TVLSI.2010.2090049},
  url = {http://dx.doi.org/10.1109/TVLSI.2010.2090049},
  researchr = {https://researchr.org/publication/WuZNNLGRNX12},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {20},
  number = {1},
  pages = {186-191},
}