Radiation Hardened Design of STT-MRAM with High Recoverability from Double Node Upset

Bo Wu, Kaili Zhang, Peng Wu, Deming Zhang, You Wang 0002. Radiation Hardened Design of STT-MRAM with High Recoverability from Double Node Upset. In 2021 IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2021, Zhuhai, China, November 24-26, 2021. pages 39-40, IEEE, 2021. [doi]

Abstract

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