Dietmar Wueller. Benefits and limitations using multifeature test charts. In Francisco H. Imai, Nitin Sampat, Feng Xiao, editors, Digital Photography VI, part of the IS&T-SPIE Electronic Imaging Symposium, San Jose, CA, USA, January 18-19, 2010, Proceedings. Volume 7537 of SPIE Proceedings, pages 75370, SPIE, 2010. [doi]
Abstract is missing.