Joachim Würfl, Eldad Bahat-Treidel, Frank Brunner, E. Cho, O. Hilt, Ponky Ivo, A. Knauer, Paul Kurpas, Richard Lossy, M. Schulz, S. Singwald, Markus Weyers, R. Zhytnytska. Reliability issues of GaN based high voltage power devices. Microelectronics Reliability, 51(9-11):1710-1716, 2011. [doi]
Abstract is missing.