Hans-Joachim Wunderlich. The design of random-testable sequential circuits. In Proceedings of the Nineteenth International Symposium on Fault-Tolerant Computing, FTCS 1989, Chicago, IL, USA, 21-23 June, 1989. pages 110-117, IEEE Computer Society, 1989. [doi]
@inproceedings{Wunderlich89,
title = {The design of random-testable sequential circuits},
author = {Hans-Joachim Wunderlich},
year = {1989},
doi = {10.1109/FTCS.1989.105552},
url = {http://dx.doi.org/10.1109/FTCS.1989.105552},
researchr = {https://researchr.org/publication/Wunderlich89},
cites = {0},
citedby = {0},
pages = {110-117},
booktitle = {Proceedings of the Nineteenth International Symposium on Fault-Tolerant Computing, FTCS 1989, Chicago, IL, USA, 21-23 June, 1989},
publisher = {IEEE Computer Society},
isbn = {0-8186-1959-7},
}