Call for Participation: 10th IEEE VLSI Design & Test Symposium. In 19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India. IEEE Computer Society, 2006. [doi]
@inproceedings{X06l:8,
title = {Call for Participation: 10th IEEE VLSI Design & Test Symposium},
year = {2006},
doi = {10.1109/VLSID.2006.55},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.55},
tags = {testing, design},
researchr = {https://researchr.org/publication/X06l%3A8},
cites = {0},
citedby = {0},
booktitle = {19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2502-4},
}