IC Reliability and Test: What Will Deep Submicron Bring? - researchr publication bibtex

researchr

You are not signed in
Sign in
Sign up

IC Reliability and Test: What Will Deep Submicron Bring?. IEEE Design & Test of Computers, 16(2):84-91, 1999.

@article{X99k,
  title = {IC Reliability and Test: What Will Deep Submicron Bring?},
  year = {1999},
  tags = {testing, reliability},
  researchr = {https://researchr.org/publication/X99k},
  cites = {0},
  citedby = {0},
  journal = {IEEE Design &amp; Test of Computers},
  volume = {16},
  number = {2},
  pages = {84-91},
}

runs on WebDSL