Automatic testing of analog ICs for latent defects using topology modification - researchr publication authors

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Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen. Automatic testing of analog ICs for latent defects using topology modification. In 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017. pages 1-6, IEEE, 2017. [doi]

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