Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris. IC laser trimming speed-up through wafer-level spatial correlation modeling. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-7, IEEE, 2014. [doi]
@inproceedings{XanthopoulosHPN14,
title = {IC laser trimming speed-up through wafer-level spatial correlation modeling},
author = {Constantinos Xanthopoulos and Ke Huang and Abbas Poonawala and Amit Nahar and Bob Orr and John M. Carulli Jr. and Yiorgos Makris},
year = {2014},
doi = {10.1109/TEST.2014.7035329},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035329},
researchr = {https://researchr.org/publication/XanthopoulosHPN14},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4722-5},
}