An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors - researchr publication

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Xhesila Xhafa, Ali Dogus Güngördü, Didem Erol, Yavuzhan Yavuz, Mustafa Berke Yelten. An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors. IEEE T. Instrumentation and Measurement, 70:1-10, 2021. [doi]

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