From Trace to Line: An Empirical Study of What Drives LLM-Based OSS Vulnerability Localization

Haoran Xi, Minghao Shao, Brendan Dolan-Gavitt, Muhammad Shafique 0001, Ramesh Karri. From Trace to Line: An Empirical Study of What Drives LLM-Based OSS Vulnerability Localization. IEEE Access, 14:124053-124066, 2026. [doi]

Abstract

Abstract is missing.