Jing Xia, Wei Chen, Yumeng Hou, Wanqi Hu, Xinxin Huang, David S. Ebert. DimScanner: A relation-based visual exploration approach towards data dimension inspection. In Gennady L. Andrienko, Shixia Liu, John T. Stasko, editors, 2016 IEEE Conference on Visual Analytics Science and Technology, VAST 2016, Baltimore, MD, USA, October 23-28, 2016. pages 81-90, IEEE Computer Society, 2016. [doi]
Abstract is missing.