Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique

Tian Xia, Rohit Shetty, Timothy Platt, Mustapha Slamani. Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique. J. Electronic Testing, 29(6):893-901, 2013. [doi]

@article{XiaSPS13,
  title = {Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique},
  author = {Tian Xia and Rohit Shetty and Timothy Platt and Mustapha Slamani},
  year = {2013},
  doi = {10.1007/s10836-013-5414-8},
  url = {http://dx.doi.org/10.1007/s10836-013-5414-8},
  researchr = {https://researchr.org/publication/XiaSPS13},
  cites = {0},
  citedby = {0},
  journal = {J. Electronic Testing},
  volume = {29},
  number = {6},
  pages = {893-901},
}