Tian Xia, Peilin Song, Hao Zheng. Characterizing the VCO jitter due to the digital simultaneous switching noise. In John Lach, Gang Qu, Yehea I. Ismail, editors, Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, Chicago, Illinois, USA, April 17-19, 2005. pages 70-73, ACM, 2005. [doi]
Abstract is missing.