Insulator recognition based on mathematical morphology and Bayesian segmentation

Fei Xia, Hai-feng Tie, En-wei Shi, Qian Zhang, Lei Wang. Insulator recognition based on mathematical morphology and Bayesian segmentation. In Qingli Li, Lipo Wang, Mei Zhou, Li Sun, Song Qiu, Hongying Liu, editors, 10th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2017, Shanghai, China, October 14-16, 2017. pages 1-5, IEEE, 2017. [doi]

Authors

Fei Xia

This author has not been identified. Look up 'Fei Xia' in Google

Hai-feng Tie

This author has not been identified. Look up 'Hai-feng Tie' in Google

En-wei Shi

This author has not been identified. Look up 'En-wei Shi' in Google

Qian Zhang

This author has not been identified. Look up 'Qian Zhang' in Google

Lei Wang

This author has not been identified. Look up 'Lei Wang' in Google