Fei Xia, Hai-feng Tie, En-wei Shi, Qian Zhang, Lei Wang. Insulator recognition based on mathematical morphology and Bayesian segmentation. In Qingli Li, Lipo Wang, Mei Zhou, Li Sun, Song Qiu, Hongying Liu, editors, 10th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2017, Shanghai, China, October 14-16, 2017. pages 1-5, IEEE, 2017. [doi]
@inproceedings{XiaTSZW17,
title = {Insulator recognition based on mathematical morphology and Bayesian segmentation},
author = {Fei Xia and Hai-feng Tie and En-wei Shi and Qian Zhang and Lei Wang},
year = {2017},
doi = {10.1109/CISP-BMEI.2017.8302063},
url = {https://doi.org/10.1109/CISP-BMEI.2017.8302063},
researchr = {https://researchr.org/publication/XiaTSZW17},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {10th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics, CISP-BMEI 2017, Shanghai, China, October 14-16, 2017},
editor = {Qingli Li and Lipo Wang and Mei Zhou and Li Sun and Song Qiu and Hongying Liu},
publisher = {IEEE},
isbn = {978-1-5386-1937-7},
}