The end-to-end chip surface defect segmentation method based on the diffusion model and attention mechanism - researchr publication

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Zilin Xia, Yufan Zhao, Jinan Gu, Wenbo Wang, Zedong Huang, Yan Gao, Peiyue Sun. The end-to-end chip surface defect segmentation method based on the diffusion model and attention mechanism. Eng. Appl. of AI, 155:111131, 2025. [doi]

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