Impact of Loss Model Selection on Power Semiconductor Lifetime Prediction in Electric Vehicles

Hongjian Xia, Yi Zhang, Dao Zhou, Minyou Chen, Wei Lai, Yunhai Wei, Huai Wang. Impact of Loss Model Selection on Power Semiconductor Lifetime Prediction in Electric Vehicles. In IECON 2022 - 48th Annual Conference of the IEEE Industrial Electronics Society, Brussels, Belgium, October 17-20, 2022. pages 1-7, IEEE, 2022. [doi]

Authors

Hongjian Xia

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Yi Zhang

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Dao Zhou

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Minyou Chen

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Wei Lai

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Yunhai Wei

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Huai Wang

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