Hongjian Xia, Yi Zhang, Dao Zhou, Minyou Chen, Wei Lai, Yunhai Wei, Huai Wang. Impact of Loss Model Selection on Power Semiconductor Lifetime Prediction in Electric Vehicles. In IECON 2022 - 48th Annual Conference of the IEEE Industrial Electronics Society, Brussels, Belgium, October 17-20, 2022. pages 1-7, IEEE, 2022. [doi]
@inproceedings{XiaZZCLWW22,
title = {Impact of Loss Model Selection on Power Semiconductor Lifetime Prediction in Electric Vehicles},
author = {Hongjian Xia and Yi Zhang and Dao Zhou and Minyou Chen and Wei Lai and Yunhai Wei and Huai Wang},
year = {2022},
doi = {10.1109/IECON49645.2022.9968430},
url = {https://doi.org/10.1109/IECON49645.2022.9968430},
researchr = {https://researchr.org/publication/XiaZZCLWW22},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {IECON 2022 - 48th Annual Conference of the IEEE Industrial Electronics Society, Brussels, Belgium, October 17-20, 2022},
publisher = {IEEE},
isbn = {978-1-6654-8025-3},
}