Dong Xiang, Mingjing Chen, Jia-Guang Sun. Scan BIST with biased scan test signals. Science in China Series F: Information Sciences, 51(7):881-895, 2008. [doi]
@article{XiangCS08,
title = {Scan BIST with biased scan test signals},
author = {Dong Xiang and Mingjing Chen and Jia-Guang Sun},
year = {2008},
doi = {10.1007/s11432-008-0078-1},
url = {http://dx.doi.org/10.1007/s11432-008-0078-1},
tags = {testing},
researchr = {https://researchr.org/publication/XiangCS08},
cites = {0},
citedby = {0},
journal = {Science in China Series F: Information Sciences},
volume = {51},
number = {7},
pages = {881-895},
}