Mingjing Chen - researchr alias

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Viewing Publication 1 - 24 from 24

2026

Cyber-physical system enabled synergistic control of energy and material flows for energy-intensive manufacturing industriesShuaiyin Ma, Yeye Cao, Yichun Cao, Benyong Yue, Mingjing Chen, Jiarong Miao, Haidong Shao. aei, 74:104722, 2026. [doi]

2025

Graph-Weighted High-Dimensional Information-Based Similarity for Detecting Altered Brain Functional Connectivity in Sleep Apnea PatientsYanxun Lu, Zhe Fei, Jingtao Zhang, Zhuo Chen, Mingjing Chen, Changhong Wang, Guanzheng Liu. tim, 74:1-10, 2025. [doi]

2024

Determinants of patients' service choice in online health communities: an elaboration likelihood model perspectiveYuangao Chen, Meng Liu, Mingjing Chen, Lu Wang 0023, Le Sun, Gang Xuan. lht, 42(6):1863-1879, 2024. [doi]

2021

Sleep apnea screening based on Photoplethysmography data from wearable bracelets using an information-based similarity approachShan Wu, Mingjing Chen, Keming Wei, Guanzheng Liu. cmpb, 211:106442, 2021. [doi]

2019

Empirical Mode Decomposition as a Novel Approach to Study Heart Rate Variability in Congestive Heart Failure AssessmentMingjing Chen, Aodi He, Kaicheng Feng, Guanzheng Liu, Qian Wang. entropy, 21(12):1169, 2019. [doi]

2014

Examining Timing Path Robustness Under Wide-Bandwidth Power Supply Noise Through Multi-Functional-Cycle Delay TestMingjing Chen, Alex Orailoglu. tvlsi, 22(4):734-746, 2014. [doi]

2012

Tackling nanoscale IC failures through noise-aware testing and silicon debuggingMingjing Chen. PhD thesis, University of California, San Diego, USA, 2012. [doi]

On Diagnosis of Timing Failures in Scan ArchitectureMingjing Chen, Alex Orailoglu. tcad, 31(7):1102-1115, 2012. [doi]

Scan Power Reduction for Linear Test Compression Schemes Through Seed SelectionMingjing Chen, Alex Orailoglu. tvlsi, 20(12):2170-2183, 2012. [doi]

2011

Diagnosing scan clock delay faults through statistical timing pruningMingjing Chen, Alex Orailoglu. dac 2011: 423-428 [doi]

Diagnosing scan chain timing faults through statistical feature analysis of scan imagesMingjing Chen, Alex Orailoglu. date 2011: 185-190 [doi]

2010

Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test schemeMingjing Chen, Alex Orailoglu. date 2010: 63-68 [doi]

VDDmin test optimization for overscreening minimization through adaptive scan chain maskingMingjing Chen, Alex Orailoglu. vts 2010: 313-318 [doi]

Squashing code size in microcoded IPs while delivering high decompression speedChengmo Yang, Mingjing Chen, Alex Orailoglu. dafes, 14(3):265-284, 2010. [doi]

2009

2008

Test cost minimization through adaptive test developmentMingjing Chen, Alex Orailoglu. iccd 2008: 234-239 [doi]

Scan BIST with biased scan test signalsDong Xiang, Mingjing Chen, Jia-Guang Sun. chinaf, 51(7):881-895, 2008. [doi]

2007

Circuit-level mismatch modelling and yield optimization for CMOS analog circuitsMingjing Chen, Alex Orailoglu. iccd 2007: 526-532 [doi]

Improving Circuit Robustness with Cost-Effective Soft-Error-Tolerant Sequential ElementsMingjing Chen, Alex Orailoglu. ats 2007: 307-312 [doi]

Using Weighted Scan Enable Signals to Improve Test Effectiveness of Scan-Based BISTDong Xiang, Mingjing Chen, Hideo Fujiwara. TC, 56(12):1619-1628, 2007. [doi]

2006

Decision Tree Based Mismatch Diagnosis in Analog CircuitsMingjing Chen, Hosam Haggag, Alex Orailoglu. vts 2006: 278-285 [doi]

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