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Test compaction for small-delay defects using an effective path selection scheme

Dong Xiang, Jianbo Li, Krishnendu Chakrabarty, Xijiang Lin. Test compaction for small-delay defects using an effective path selection scheme. ACM Trans. Design Autom. Electr. Syst., 18(3):44, 2013. [doi]

Authors

Dong Xiang

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Jianbo Li

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Krishnendu Chakrabarty

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Xijiang Lin

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