Dong Xiang, Jianbo Li, Krishnendu Chakrabarty, Xijiang Lin. Test compaction for small-delay defects using an effective path selection scheme. ACM Trans. Design Autom. Electr. Syst., 18(3):44, 2013. [doi]
@article{XiangLCL13,
title = {Test compaction for small-delay defects using an effective path selection scheme},
author = {Dong Xiang and Jianbo Li and Krishnendu Chakrabarty and Xijiang Lin},
year = {2013},
doi = {10.1145/2491477.2491488},
url = {http://doi.acm.org/10.1145/2491477.2491488},
researchr = {https://researchr.org/publication/XiangLCL13},
cites = {0},
citedby = {0},
journal = {ACM Trans. Design Autom. Electr. Syst.},
volume = {18},
number = {3},
pages = {44},
}