Thermal-Aware Small-Delay Defect Testing in Integrated Circuits for Mitigating Overkill - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Dong Xiang, Kele Shen, Bhargab B. Bhattacharya, Xiaoqing Wen, Xijiang Lin. Thermal-Aware Small-Delay Defect Testing in Integrated Circuits for Mitigating Overkill. IEEE Trans. on CAD of Integrated Circuits and Systems, 35(3):499-512, 2016. [doi]

This author has not been identified. Look up 'Dong Xiang' in GoogleThis author has not been identified. Look up 'Kele Shen' in GoogleThis author has not been identified. Look up 'Bhargab B. Bhattacharya' in GoogleThis author has not been identified. Look up 'Xiaoqing Wen' in GoogleThis author has not been identified. Look up 'Xijiang Lin' in Google

runs on WebDSL